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Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte

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Authors
Radonjić, Aleksandar
Article (Published version)
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Abstract
Correcting single and detecting adjacent errors has become important in memory systems using high density DRAM chips. The reason is that, in these systems, the strike of a single energetic particle can upset one or more adjacent bits. In this article, we present a simple solution for this problem based on integer codes capable of correcting single errors and detecting l -bit burst errors confined to a b -bit byte ( 1<l<b ). Unlike the classical approach, the proposed one does not rely on the use of dedicated encoding/decoding hardware. Instead, it uses the processor as both encoder and decoder. The effectiveness of such solution is demonstrated on a theoretical model of an eight-core processor. The obtained results show that it has the potential to be used in future DDR5 systems.
Keywords:
materials reliability / DRAM chips / decoding / error corection / hardware / software / integer codes / single errors / burst errors / eight-core processor
Source:
IEEE Transactions on Device and Materials Reliability, 2020, 20, 4, 748-753
Publisher:
  • Institute of Electrical and Electronics Engineers (IEEE)
Projects:
  • Ministry of Education, Science and Technological Development, Republic of Serbia, Grant no. 451-03-68/2020-14/200175 (Institute of Technical Sciences of SASA, Belgrade) (RS-200175)
Note:
  • Peer-reviewed manuscript: https://dais.sanu.ac.rs/123456789/9997

DOI: 10.1109/TDMR.2020.3033511

ISSN: 1530-4388; 1558-2574

WoS: 000597157500015

[ Google Scholar ]
URI
https://dais.sanu.ac.rs/123456789/9998
Collections
  • ITN SANU - Opšta kolekcija / ITS SASA - General collection
Institution
Институт техничких наука САНУ / Institute of Technical Sciences SASA

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  • Integer Codes Correcting Double Errors and Triple-Adjacent Errors Within a Byte 

    Radonjić, Aleksandar (Institute of Electrical and Electronics Engineers (IEEE), 2020)
  • Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte 

    Radonjić, Aleksandar (Institute of Electrical and Electronics Engineers (IEEE), 2020)

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