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Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
dc.creator | Nikolić, Maria Vesna | |
dc.creator | Satoh, K. | |
dc.creator | Ivetić, Tamara | |
dc.creator | Paraskevopoulos, Konstantinos M. | |
dc.creator | Zorba, Triantafyllia T. | |
dc.creator | Blagojević, Vladimir D. | |
dc.creator | Mančić, Lidija | |
dc.creator | Nikolić, Pantelija M. | |
dc.date.accessioned | 2018-07-29T19:36:51Z | |
dc.date.available | 2018-07-29T19:36:51Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0040-6090 | |
dc.identifier.uri | https://dais.sanu.ac.rs/123456789/3577 | |
dc.description.abstract | Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved. | en |
dc.publisher | Elsevier | |
dc.relation | info:eu-repo/grantAgreement/MESTD/MPN2006-2010/142011/RS// | |
dc.rights | restrictedAccess | |
dc.source | Thin Solid Films | |
dc.subject | Fourier transform infrared spectroscopy | |
dc.subject | optical properties | |
dc.subject | Rietveld analysis | |
dc.subject | sputtering | |
dc.subject | X-ray diffraction | |
dc.subject | zinc-stannate | |
dc.title | Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering | en |
dc.type | article | en |
dc.rights.license | ARR | |
dcterms.abstract | Николић, Пантелија М.; Николић, Мариа Весна; Иветић, Тамара; Параскевопоулос, Константинос М.; Зорба, Триантафyллиа Т.; Сатох, К.; Благојевић, Владимир Д.; Манчић, Лидија; | |
dc.citation.spage | 6293 | |
dc.citation.epage | 6299 | |
dc.citation.volume | 516 | |
dc.citation.issue | 18 | |
dc.identifier.wos | 000258037300057 | |
dc.identifier.doi | 10.1016/j.tsf.2007.12.118 | |
dc.identifier.scopus | 2-s2.0-44649101331 | |
dc.type.version | publishedVersion | |
dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_dais_3577 |