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dc.creatorNikolić, Maria Vesna
dc.creatorSatoh, K.
dc.creatorIvetić, Tamara
dc.creatorParaskevopoulos, Konstantinos M.
dc.creatorZorba, Triantafyllia T.
dc.creatorBlagojević, Vladimir D.
dc.creatorMančić, Lidija
dc.creatorNikolić, Pantelija M.
dc.date.accessioned2018-07-29T19:36:51Z
dc.date.available2018-07-29T19:36:51Z
dc.date.issued2008
dc.identifier.issn0040-6090
dc.identifier.urihttp://dais.sanu.ac.rs/123456789/3577
dc.description.abstractSingle-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.en
dc.publisherElsevier
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/142011/RS//
dc.rightsrestrictedAccess
dc.sourceThin Solid Films
dc.subjectFourier transform infrared spectroscopy
dc.subjectoptical properties
dc.subjectRietveld analysis
dc.subjectsputtering
dc.subjectX-ray diffraction
dc.subjectzinc-stannate
dc.titleInfrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputteringen
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractНиколић, Пантелија М.; Николић, Мариа Весна; Иветић, Тамара; Параскевопоулос, Константинос М.; Зорба, Триантафyллиа Т.; Сатох, К.; Благојевић, Владимир Д.; Манчић, Лидија;
dc.citation.spage6293
dc.citation.epage6299
dc.citation.volume516
dc.citation.issue18
dc.identifier.wos000258037300057
dc.identifier.doi10.1016/j.tsf.2007.12.118
dc.identifier.scopus2-s2.0-44649101331
dc.type.versionpublishedVersion


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