Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
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AuthorsNikolić, Maria Vesna
Paraskevopoulos, Konstantinos M.
Zorba, Triantafyllia T.
Blagojević, Vladimir D.
Nikolić, Pantelija M.
Article (Published version)
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Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.
Keywords:Fourier transform infrared spectroscopy / optical properties / Rietveld analysis / sputtering / X-ray diffraction / zinc-stannate
Source:Thin Solid Films, 2008, 516, 18, 6293-6299