Single crystal samples of Pb0.9Sn0.1Te doped with Yb, Sm or Gd were produced using the Bridgman method. Far infrared reflectivity spectra were measured at room temperature for highly polished samples with various impurity concentration (between 0.2 at% and 1 at %). The experimental diagrams were numerically analyzed using a fitting procedure based on the plasma-phonon interaction model and the optical parameters were determined. The application of lead- tin tellurides doped with rare earth elements for infrared astronomy has been discussed.
Keywords:
rare earths / semiconductors / far infrared spectroscopy
Source:
Journal of Optoelectronics and Advanced Materials, 2009, 11, 4, 457-460
Publisher:
Bucharest : National R&D Institute for Optoelectronics
TY - JOUR
AU - Nikolić, Pantelija M.
AU - Paraskevopoulos, Konstantinos M.
AU - Nikolić, Maria Vesna
AU - Stamenović, Bojana
AU - Zorba, Triantafyllia T.
AU - Vujatović, Stevan S.
AU - Blagojević, Vladimir D.
AU - Bojčic, A.
PY - 2009
UR - https://dais.sanu.ac.rs/123456789/3470
AB - Single crystal samples of Pb0.9Sn0.1Te doped with Yb, Sm or Gd were produced using the Bridgman method. Far infrared reflectivity spectra were measured at room temperature for highly polished samples with various impurity concentration (between 0.2 at% and 1 at %). The experimental diagrams were numerically analyzed using a fitting procedure based on the plasma-phonon interaction model and the optical parameters were determined. The application of lead- tin tellurides doped with rare earth elements for infrared astronomy has been discussed.
PB - Bucharest : National R&D Institute for Optoelectronics
T2 - Journal of Optoelectronics and Advanced Materials
T1 - Far infrared study of some rare earth impurities in crystals of Pb 1-xSnx alloys
SP - 457
EP - 460
VL - 11
IS - 4
UR - https://hdl.handle.net/21.15107/rcub_dais_3470
ER -
@article{
author = "Nikolić, Pantelija M. and Paraskevopoulos, Konstantinos M. and Nikolić, Maria Vesna and Stamenović, Bojana and Zorba, Triantafyllia T. and Vujatović, Stevan S. and Blagojević, Vladimir D. and Bojčic, A.",
year = "2009",
abstract = "Single crystal samples of Pb0.9Sn0.1Te doped with Yb, Sm or Gd were produced using the Bridgman method. Far infrared reflectivity spectra were measured at room temperature for highly polished samples with various impurity concentration (between 0.2 at% and 1 at %). The experimental diagrams were numerically analyzed using a fitting procedure based on the plasma-phonon interaction model and the optical parameters were determined. The application of lead- tin tellurides doped with rare earth elements for infrared astronomy has been discussed.",
publisher = "Bucharest : National R&D Institute for Optoelectronics",
journal = "Journal of Optoelectronics and Advanced Materials",
title = "Far infrared study of some rare earth impurities in crystals of Pb 1-xSnx alloys",
pages = "457-460",
volume = "11",
number = "4",
url = "https://hdl.handle.net/21.15107/rcub_dais_3470"
}
Nikolić, P. M., Paraskevopoulos, K. M., Nikolić, M. V., Stamenović, B., Zorba, T. T., Vujatović, S. S., Blagojević, V. D.,& Bojčic, A.. (2009). Far infrared study of some rare earth impurities in crystals of Pb 1-xSnx alloys. in Journal of Optoelectronics and Advanced Materials
Bucharest : National R&D Institute for Optoelectronics., 11(4), 457-460.
https://hdl.handle.net/21.15107/rcub_dais_3470
Nikolić PM, Paraskevopoulos KM, Nikolić MV, Stamenović B, Zorba TT, Vujatović SS, Blagojević VD, Bojčic A. Far infrared study of some rare earth impurities in crystals of Pb 1-xSnx alloys. in Journal of Optoelectronics and Advanced Materials. 2009;11(4):457-460.
https://hdl.handle.net/21.15107/rcub_dais_3470 .
Nikolić, Pantelija M., Paraskevopoulos, Konstantinos M., Nikolić, Maria Vesna, Stamenović, Bojana, Zorba, Triantafyllia T., Vujatović, Stevan S., Blagojević, Vladimir D., Bojčic, A., "Far infrared study of some rare earth impurities in crystals of Pb 1-xSnx alloys" in Journal of Optoelectronics and Advanced Materials, 11, no. 4 (2009):457-460,
https://hdl.handle.net/21.15107/rcub_dais_3470 .
