TY  - JOUR
AU  - Nikolić, Maria Vesna
AU  - Satoh, K.
AU  - Ivetić, Tamara
AU  - Paraskevopoulos, Konstantinos M.
AU  - Zorba, Triantafyllia T.
AU  - Blagojević, Vladimir D.
AU  - Mančić, Lidija
AU  - Nikolić, Pantelija M.
PY  - 2008
UR  - https://dais.sanu.ac.rs/123456789/3577
AB  - Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.
PB  - Elsevier
T2  - Thin Solid Films
T1  - Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
SP  - 6293
EP  - 6299
VL  - 516
IS  - 18
DO  - 10.1016/j.tsf.2007.12.118
UR  - https://hdl.handle.net/21.15107/rcub_dais_3577
ER  - 

@article{
author = "Nikolić, Maria Vesna and Satoh, K. and Ivetić, Tamara and Paraskevopoulos, Konstantinos M. and Zorba, Triantafyllia T. and Blagojević, Vladimir D. and Mančić, Lidija and Nikolić, Pantelija M.",
year = "2008",
abstract = "Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.",
publisher = "Elsevier",
journal = "Thin Solid Films",
title = "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering",
pages = "6293-6299",
volume = "516",
number = "18",
doi = "10.1016/j.tsf.2007.12.118",
url = "https://hdl.handle.net/21.15107/rcub_dais_3577"
}

Nikolić, M. V., Satoh, K., Ivetić, T., Paraskevopoulos, K. M., Zorba, T. T., Blagojević, V. D., Mančić, L.,& Nikolić, P. M.. (2008). Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films
Elsevier., 516(18), 6293-6299.
https://doi.org/10.1016/j.tsf.2007.12.118
https://hdl.handle.net/21.15107/rcub_dais_3577

Nikolić MV, Satoh K, Ivetić T, Paraskevopoulos KM, Zorba TT, Blagojević VD, Mančić L, Nikolić PM. Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films. 2008;516(18):6293-6299.
doi:10.1016/j.tsf.2007.12.118
https://hdl.handle.net/21.15107/rcub_dais_3577 .

Nikolić, Maria Vesna, Satoh, K., Ivetić, Tamara, Paraskevopoulos, Konstantinos M., Zorba, Triantafyllia T., Blagojević, Vladimir D., Mančić, Lidija, Nikolić, Pantelija M., "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering" in Thin Solid Films, 516, no. 18 (2008):6293-6299,
https://doi.org/10.1016/j.tsf.2007.12.118 .,
https://hdl.handle.net/21.15107/rcub_dais_3577 .