TY  - JOUR
AU  - Jovalekić, Čedomir
AU  - Zdujić, Miodrag
AU  - Atanasoska, Ljiljana
PY  - 2009
UR  - https://dais.sanu.ac.rs/123456789/3469
AB  - The Auger and XPS technique has been used for investigation in the surface of bismuth titanate (Bi4Ti3O12) (BIT) ceramics obtained by reactive sintering from Bi2O3 and TiO2 oxides. All peaks characteristic for bismuth, titanium and oxygen are clearly visible in the spectrum. Oxygen vacancies are preferentially sited in the vicinity of bismuth ions observed by our X-ray photoemission data. The variation in the valence state of titanium ions is also possible. The XPS and AES measurements confirm that the surface elemental composition of bismuth titanate ceramics does not deviate from nominal bulk composition. © 2008 Elsevier B.V. All rights reserved.
PB  - Elsevier
T2  - Journal of Alloys and Compounds
T1  - Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy
SP  - 441
EP  - 444
VL  - 469
IS  - 1-2
DO  - 10.1016/j.jallcom.2008.01.131
UR  - https://hdl.handle.net/21.15107/rcub_dais_3469
ER  - 

@article{
author = "Jovalekić, Čedomir and Zdujić, Miodrag and Atanasoska, Ljiljana",
year = "2009",
abstract = "The Auger and XPS technique has been used for investigation in the surface of bismuth titanate (Bi4Ti3O12) (BIT) ceramics obtained by reactive sintering from Bi2O3 and TiO2 oxides. All peaks characteristic for bismuth, titanium and oxygen are clearly visible in the spectrum. Oxygen vacancies are preferentially sited in the vicinity of bismuth ions observed by our X-ray photoemission data. The variation in the valence state of titanium ions is also possible. The XPS and AES measurements confirm that the surface elemental composition of bismuth titanate ceramics does not deviate from nominal bulk composition. © 2008 Elsevier B.V. All rights reserved.",
publisher = "Elsevier",
journal = "Journal of Alloys and Compounds",
title = "Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy",
pages = "441-444",
volume = "469",
number = "1-2",
doi = "10.1016/j.jallcom.2008.01.131",
url = "https://hdl.handle.net/21.15107/rcub_dais_3469"
}

Jovalekić, Č., Zdujić, M.,& Atanasoska, L.. (2009). Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy. in Journal of Alloys and Compounds
Elsevier., 469(1-2), 441-444.
https://doi.org/10.1016/j.jallcom.2008.01.131
https://hdl.handle.net/21.15107/rcub_dais_3469

Jovalekić Č, Zdujić M, Atanasoska L. Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy. in Journal of Alloys and Compounds. 2009;469(1-2):441-444.
doi:10.1016/j.jallcom.2008.01.131
https://hdl.handle.net/21.15107/rcub_dais_3469 .

Jovalekić, Čedomir, Zdujić, Miodrag, Atanasoska, Ljiljana, "Surface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy" in Journal of Alloys and Compounds, 469, no. 1-2 (2009):441-444,
https://doi.org/10.1016/j.jallcom.2008.01.131 .,
https://hdl.handle.net/21.15107/rcub_dais_3469 .

TY  - JOUR
AU  - Atanasoska, Ljiljana
AU  - Atanasoski, Radoslav
AU  - Trasatti, Sergio
PY  - 1990
UR  - https://dais.sanu.ac.rs/123456789/10496
AB  - The surface composition of RuO2+IrO2 mixed oxide layers (1-2 μm thick) deposited on titanium by thermal degradation of the corresponding chlorides in aqueous or isopropanol solutions has been investigated. A surface enrichment with Ir, more pronounced for the layers obtained from isopropanol, has always been found. Electrochemical data reflecting the surface properties of RuO2+IrO2 at the surface.
PB  - Elsevier
T2  - Vaccum
T1  - XPS and AES study of mixed layers of RuO2 and IrO2
SP  - 91
EP  - 94
VL  - 40
IS  - 1-2
DO  - 10.1016/0042-207X(90)90127-K
UR  - https://hdl.handle.net/21.15107/rcub_dais_10496
ER  - 

@article{
author = "Atanasoska, Ljiljana and Atanasoski, Radoslav and Trasatti, Sergio",
year = "1990",
abstract = "The surface composition of RuO2+IrO2 mixed oxide layers (1-2 μm thick) deposited on titanium by thermal degradation of the corresponding chlorides in aqueous or isopropanol solutions has been investigated. A surface enrichment with Ir, more pronounced for the layers obtained from isopropanol, has always been found. Electrochemical data reflecting the surface properties of RuO2+IrO2 at the surface.",
publisher = "Elsevier",
journal = "Vaccum",
title = "XPS and AES study of mixed layers of RuO2 and IrO2",
pages = "91-94",
volume = "40",
number = "1-2",
doi = "10.1016/0042-207X(90)90127-K",
url = "https://hdl.handle.net/21.15107/rcub_dais_10496"
}

Atanasoska, L., Atanasoski, R.,& Trasatti, S.. (1990). XPS and AES study of mixed layers of RuO2 and IrO2. in Vaccum
Elsevier., 40(1-2), 91-94.
https://doi.org/10.1016/0042-207X(90)90127-K
https://hdl.handle.net/21.15107/rcub_dais_10496

Atanasoska L, Atanasoski R, Trasatti S. XPS and AES study of mixed layers of RuO2 and IrO2. in Vaccum. 1990;40(1-2):91-94.
doi:10.1016/0042-207X(90)90127-K
https://hdl.handle.net/21.15107/rcub_dais_10496 .

Atanasoska, Ljiljana, Atanasoski, Radoslav, Trasatti, Sergio, "XPS and AES study of mixed layers of RuO2 and IrO2" in Vaccum, 40, no. 1-2 (1990):91-94,
https://doi.org/10.1016/0042-207X(90)90127-K .,
https://hdl.handle.net/21.15107/rcub_dais_10496 .

TY  - JOUR
AU  - Kozlowski, Mark R.
AU  - Smyrl, William H.
AU  - Atanasoska, Ljiljana L.
AU  - Atanasoski, Radoslav T.
PY  - 1989
UR  - https://dais.sanu.ac.rs/123456789/10497
AB  - Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide
PB  - Elsevier
T2  - Electrochimica Acta
T1  - Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium
SP  - 1763
EP  - 1768
VL  - 34
IS  - 12
DO  - 10.1016/0013-4686(89)85062-5
UR  - https://hdl.handle.net/21.15107/rcub_dais_10497
ER  - 

@article{
author = "Kozlowski, Mark R. and Smyrl, William H. and Atanasoska, Ljiljana L. and Atanasoski, Radoslav T.",
year = "1989",
abstract = "Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide",
publisher = "Elsevier",
journal = "Electrochimica Acta",
title = "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium",
pages = "1763-1768",
volume = "34",
number = "12",
doi = "10.1016/0013-4686(89)85062-5",
url = "https://hdl.handle.net/21.15107/rcub_dais_10497"
}

Kozlowski, M. R., Smyrl, W. H., Atanasoska, L. L.,& Atanasoski, R. T.. (1989). Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta
Elsevier., 34(12), 1763-1768.
https://doi.org/10.1016/0013-4686(89)85062-5
https://hdl.handle.net/21.15107/rcub_dais_10497

Kozlowski MR, Smyrl WH, Atanasoska LL, Atanasoski RT. Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta. 1989;34(12):1763-1768.
doi:10.1016/0013-4686(89)85062-5
https://hdl.handle.net/21.15107/rcub_dais_10497 .

Kozlowski, Mark R., Smyrl, William H., Atanasoska, Ljiljana L., Atanasoski, Radoslav T., "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium" in Electrochimica Acta, 34, no. 12 (1989):1763-1768,
https://doi.org/10.1016/0013-4686(89)85062-5 .,
https://hdl.handle.net/21.15107/rcub_dais_10497 .

TY  - JOUR
AU  - Atanasoska, Ljiljana L.
AU  - O'Grady, William E.
AU  - Atanasoski, Radoslav T.
AU  - Pollak, Fred Hugo
PY  - 1988
UR  - https://dais.sanu.ac.rs/123456789/10498
AB  - The (110) and the (100) surfaces of RuO2 show well defined LEED patterns. The surface lattice dimensions agree within 5% with the values predicted from X-ray diffraction. Both surfaces undergo a series of reversible surface reconstructions which result in well defined LEED patterns. These states come about from the loss of surface oxygen and each oxygen and each state is characterized by a well defined O Ru ratio. The final state is an overlayer of Ru metal. Furthermore, nearly equal concentrations of RuO3 are observed on all of the surfaces regardless of the structure which is present. This suggests that RuO3 plays a significant role in the stability of RuO2 surfaces.
PB  - Elsevier
T2  - Surface Science
T1  - The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces
SP  - 142
EP  - 166
VL  - 202
IS  - 1-2
DO  - 10.1016/0039-6028(88)90066-0
UR  - https://hdl.handle.net/21.15107/rcub_dais_10498
ER  - 

@article{
author = "Atanasoska, Ljiljana L. and O'Grady, William E. and Atanasoski, Radoslav T. and Pollak, Fred Hugo",
year = "1988",
abstract = "The (110) and the (100) surfaces of RuO2 show well defined LEED patterns. The surface lattice dimensions agree within 5% with the values predicted from X-ray diffraction. Both surfaces undergo a series of reversible surface reconstructions which result in well defined LEED patterns. These states come about from the loss of surface oxygen and each oxygen and each state is characterized by a well defined O Ru ratio. The final state is an overlayer of Ru metal. Furthermore, nearly equal concentrations of RuO3 are observed on all of the surfaces regardless of the structure which is present. This suggests that RuO3 plays a significant role in the stability of RuO2 surfaces.",
publisher = "Elsevier",
journal = "Surface Science",
title = "The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces",
pages = "142-166",
volume = "202",
number = "1-2",
doi = "10.1016/0039-6028(88)90066-0",
url = "https://hdl.handle.net/21.15107/rcub_dais_10498"
}

Atanasoska, L. L., O'Grady, W. E., Atanasoski, R. T.,& Pollak, F. H.. (1988). The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces. in Surface Science
Elsevier., 202(1-2), 142-166.
https://doi.org/10.1016/0039-6028(88)90066-0
https://hdl.handle.net/21.15107/rcub_dais_10498

Atanasoska LL, O'Grady WE, Atanasoski RT, Pollak FH. The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces. in Surface Science. 1988;202(1-2):142-166.
doi:10.1016/0039-6028(88)90066-0
https://hdl.handle.net/21.15107/rcub_dais_10498 .

Atanasoska, Ljiljana L., O'Grady, William E., Atanasoski, Radoslav T., Pollak, Fred Hugo, "The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces" in Surface Science, 202, no. 1-2 (1988):142-166,
https://doi.org/10.1016/0039-6028(88)90066-0 .,
https://hdl.handle.net/21.15107/rcub_dais_10498 .