TY  - JOUR
AU  - Kozlowski, Mark R.
AU  - Smyrl, William H.
AU  - Atanasoska, Ljiljana L.
AU  - Atanasoski, Radoslav T.
PY  - 1989
UR  - https://dais.sanu.ac.rs/123456789/10497
AB  - Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide
PB  - Elsevier
T2  - Electrochimica Acta
T1  - Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium
SP  - 1763
EP  - 1768
VL  - 34
IS  - 12
DO  - 10.1016/0013-4686(89)85062-5
UR  - https://hdl.handle.net/21.15107/rcub_dais_10497
ER  - 

@article{
author = "Kozlowski, Mark R. and Smyrl, William H. and Atanasoska, Ljiljana L. and Atanasoski, Radoslav T.",
year = "1989",
abstract = "Auger depth profiling was used to determine the local film thickness of a thin anodic oxide grown on a polycrystalline Ti substrate. The oxide thickness was studied as a function of substrate crystallography and final growth voltage. These results were related to local photocurrent measurements obtained using photoelectrochemical microscopy. Variations in the film thickness are too small to account for the non-uniform photocurrent response. The non-uniform photoresponse is instead attributed to variations in the defect density of the oxide",
publisher = "Elsevier",
journal = "Electrochimica Acta",
title = "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium",
pages = "1763-1768",
volume = "34",
number = "12",
doi = "10.1016/0013-4686(89)85062-5",
url = "https://hdl.handle.net/21.15107/rcub_dais_10497"
}

Kozlowski, M. R., Smyrl, W. H., Atanasoska, L. L.,& Atanasoski, R. T.. (1989). Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta
Elsevier., 34(12), 1763-1768.
https://doi.org/10.1016/0013-4686(89)85062-5
https://hdl.handle.net/21.15107/rcub_dais_10497

Kozlowski MR, Smyrl WH, Atanasoska LL, Atanasoski RT. Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium. in Electrochimica Acta. 1989;34(12):1763-1768.
doi:10.1016/0013-4686(89)85062-5
https://hdl.handle.net/21.15107/rcub_dais_10497 .

Kozlowski, Mark R., Smyrl, William H., Atanasoska, Ljiljana L., Atanasoski, Radoslav T., "Local film thickness and photoresponse of thin anodic TiO2 films on polycrystalline titanium" in Electrochimica Acta, 34, no. 12 (1989):1763-1768,
https://doi.org/10.1016/0013-4686(89)85062-5 .,
https://hdl.handle.net/21.15107/rcub_dais_10497 .

TY  - JOUR
AU  - Atanasoska, Ljiljana L.
AU  - O'Grady, William E.
AU  - Atanasoski, Radoslav T.
AU  - Pollak, Fred Hugo
PY  - 1988
UR  - https://dais.sanu.ac.rs/123456789/10498
AB  - The (110) and the (100) surfaces of RuO2 show well defined LEED patterns. The surface lattice dimensions agree within 5% with the values predicted from X-ray diffraction. Both surfaces undergo a series of reversible surface reconstructions which result in well defined LEED patterns. These states come about from the loss of surface oxygen and each oxygen and each state is characterized by a well defined O Ru ratio. The final state is an overlayer of Ru metal. Furthermore, nearly equal concentrations of RuO3 are observed on all of the surfaces regardless of the structure which is present. This suggests that RuO3 plays a significant role in the stability of RuO2 surfaces.
PB  - Elsevier
T2  - Surface Science
T1  - The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces
SP  - 142
EP  - 166
VL  - 202
IS  - 1-2
DO  - 10.1016/0039-6028(88)90066-0
UR  - https://hdl.handle.net/21.15107/rcub_dais_10498
ER  - 

@article{
author = "Atanasoska, Ljiljana L. and O'Grady, William E. and Atanasoski, Radoslav T. and Pollak, Fred Hugo",
year = "1988",
abstract = "The (110) and the (100) surfaces of RuO2 show well defined LEED patterns. The surface lattice dimensions agree within 5% with the values predicted from X-ray diffraction. Both surfaces undergo a series of reversible surface reconstructions which result in well defined LEED patterns. These states come about from the loss of surface oxygen and each oxygen and each state is characterized by a well defined O Ru ratio. The final state is an overlayer of Ru metal. Furthermore, nearly equal concentrations of RuO3 are observed on all of the surfaces regardless of the structure which is present. This suggests that RuO3 plays a significant role in the stability of RuO2 surfaces.",
publisher = "Elsevier",
journal = "Surface Science",
title = "The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces",
pages = "142-166",
volume = "202",
number = "1-2",
doi = "10.1016/0039-6028(88)90066-0",
url = "https://hdl.handle.net/21.15107/rcub_dais_10498"
}

Atanasoska, L. L., O'Grady, W. E., Atanasoski, R. T.,& Pollak, F. H.. (1988). The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces. in Surface Science
Elsevier., 202(1-2), 142-166.
https://doi.org/10.1016/0039-6028(88)90066-0
https://hdl.handle.net/21.15107/rcub_dais_10498

Atanasoska LL, O'Grady WE, Atanasoski RT, Pollak FH. The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces. in Surface Science. 1988;202(1-2):142-166.
doi:10.1016/0039-6028(88)90066-0
https://hdl.handle.net/21.15107/rcub_dais_10498 .

Atanasoska, Ljiljana L., O'Grady, William E., Atanasoski, Radoslav T., Pollak, Fred Hugo, "The surface structure of RuO2: A leed, auger and XPS study of the (110) and (100) faces" in Surface Science, 202, no. 1-2 (1988):142-166,
https://doi.org/10.1016/0039-6028(88)90066-0 .,
https://hdl.handle.net/21.15107/rcub_dais_10498 .