Quantitative metallography modern metods

Abstract

This paper has been concerned with the classical Stereological targets V, S, L, and N only, namely with so-called first-order properties. Stereology is now drifting rapidly toward second-order methods, aimed at quantifying spatial pattern for the elements of a structure (e.g. clustering, repulsion, etc., between the elements) as well as the nature and degree of association between different structures. Second-order statistical methods are widely available for point patterns. Important devices for the second-order analysis of cells and organelles when regarded as points in space have recently been devised. Analogous methods extend to higher dimensional quantities such as surface areas and volumes.