Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering
Само за регистроване кориснике
2008
Аутори
Nikolić, Maria VesnaSatoh, K.
Ivetić, Tamara
Paraskevopoulos, Konstantinos M.
Zorba, Triantafyllia T.
Blagojević, Vladimir D.
Mančić, Lidija
Nikolić, Pantelija M.
Чланак у часопису (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.
Кључне речи:
Fourier transform infrared spectroscopy / optical properties / Rietveld analysis / sputtering / X-ray diffraction / zinc-stannateИзвор:
Thin Solid Films, 2008, 516, 18, 6293-6299Издавач:
- Elsevier
Финансирање / пројекти:
- Проучавање међузависности у тријади ''синтеза-структура-својства'' за функционалне материјала (RS-MESTD-MPN2006-2010-142011)
DOI: 10.1016/j.tsf.2007.12.118
ISSN: 0040-6090
WoS: 000258037300057
Scopus: 2-s2.0-44649101331
Институција/група
Институт техничких наука САНУ / Institute of Technical Sciences of SASATY - JOUR AU - Nikolić, Maria Vesna AU - Satoh, K. AU - Ivetić, Tamara AU - Paraskevopoulos, Konstantinos M. AU - Zorba, Triantafyllia T. AU - Blagojević, Vladimir D. AU - Mančić, Lidija AU - Nikolić, Pantelija M. PY - 2008 UR - https://dais.sanu.ac.rs/123456789/3577 AB - Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved. PB - Elsevier T2 - Thin Solid Films T1 - Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering SP - 6293 EP - 6299 VL - 516 IS - 18 DO - 10.1016/j.tsf.2007.12.118 UR - https://hdl.handle.net/21.15107/rcub_dais_3577 ER -
@article{ author = "Nikolić, Maria Vesna and Satoh, K. and Ivetić, Tamara and Paraskevopoulos, Konstantinos M. and Zorba, Triantafyllia T. and Blagojević, Vladimir D. and Mančić, Lidija and Nikolić, Pantelija M.", year = "2008", abstract = "Single-phase zinc-stannate thin films of different thickness values were prepared by radio frequency magnetron sputtering on a silica substrate. Rietveld analysis of X-ray diffraction data confirmed that the films had an inverse spinel structure, with a cation inversion parameter of 0.8. Room temperature far and mid infrared reflectivity spectra were measured in the range 50-4000 cm- 1. The reflectivity diagrams were analyzed using the four-parameter model of coupled oscillators for optical phonons with a standard multi-layer technique taking into account the thin-film layer and the substrate. The optical parameters were determined for seven oscillators belonging to the spinel structure. Their origin was discussed in relation to non-stoichiometry of the thin film and cation disorder in the crystal lattice. Born effective charges were calculated from the transversal/longitudinal splitting. © 2007 Elsevier B.V. All rights reserved.", publisher = "Elsevier", journal = "Thin Solid Films", title = "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering", pages = "6293-6299", volume = "516", number = "18", doi = "10.1016/j.tsf.2007.12.118", url = "https://hdl.handle.net/21.15107/rcub_dais_3577" }
Nikolić, M. V., Satoh, K., Ivetić, T., Paraskevopoulos, K. M., Zorba, T. T., Blagojević, V. D., Mančić, L.,& Nikolić, P. M.. (2008). Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films Elsevier., 516(18), 6293-6299. https://doi.org/10.1016/j.tsf.2007.12.118 https://hdl.handle.net/21.15107/rcub_dais_3577
Nikolić MV, Satoh K, Ivetić T, Paraskevopoulos KM, Zorba TT, Blagojević VD, Mančić L, Nikolić PM. Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering. in Thin Solid Films. 2008;516(18):6293-6299. doi:10.1016/j.tsf.2007.12.118 https://hdl.handle.net/21.15107/rcub_dais_3577 .
Nikolić, Maria Vesna, Satoh, K., Ivetić, Tamara, Paraskevopoulos, Konstantinos M., Zorba, Triantafyllia T., Blagojević, Vladimir D., Mančić, Lidija, Nikolić, Pantelija M., "Infrared reflection spectroscopy of Zn2SnO4 thin films deposited on silica substrate by radio frequency magnetron sputtering" in Thin Solid Films, 516, no. 18 (2008):6293-6299, https://doi.org/10.1016/j.tsf.2007.12.118 ., https://hdl.handle.net/21.15107/rcub_dais_3577 .