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dc.creatorJovalekić, Čedomir
dc.creatorZdujić, Miodrag
dc.creatorAtanasoska, Ljiljana
dc.date.accessioned2018-07-06T17:02:31Z
dc.date.available2018-07-06T17:02:31Z
dc.date.issued2009
dc.identifier.issn0925-8388
dc.identifier.urihttp://dais.sanu.ac.rs/123456789/3469
dc.description.abstractThe Auger and XPS technique has been used for investigation in the surface of bismuth titanate (Bi4Ti3O12) (BIT) ceramics obtained by reactive sintering from Bi2O3 and TiO2 oxides. All peaks characteristic for bismuth, titanium and oxygen are clearly visible in the spectrum. Oxygen vacancies are preferentially sited in the vicinity of bismuth ions observed by our X-ray photoemission data. The variation in the valence state of titanium ions is also possible. The XPS and AES measurements confirm that the surface elemental composition of bismuth titanate ceramics does not deviate from nominal bulk composition. © 2008 Elsevier B.V. All rights reserved.
dc.publisherElsevier
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/141027/RS//
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/142030/RS//
dc.rightsrestrictedAccess
dc.sourceJournal of Alloys and Compounds
dc.subjectferroelectrics
dc.subjectsintering
dc.subjectphotoelectron spectroscopy
dc.titleSurface analysis of bismuth titanate by Auger and X-ray photoelectron spectroscopy
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractЈовалекић, Чедомир; Aтанасоска, Љиљана; Здујић, Миодраг;
dc.citation.spage441
dc.citation.epage444
dc.citation.volume469
dc.citation.issue1-2
dc.identifier.wos000263801500077
dc.identifier.doi10.1016/j.jallcom.2008.01.131
dc.identifier.scopus2-s2.0-58349112150
dc.type.versionpublishedVersion


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