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dc.creatorSavić, Slavica M.
dc.creatorStojanović, G. M.
dc.creatorNikolić, Maria Vesna
dc.creatorAleksić, Obrad S.
dc.creatorLuković Golić, Danijela
dc.creatorNikolić, Pantelija M.
dc.date.accessioned2018-07-06T17:00:04Z
dc.date.available2018-07-06T17:00:04Z
dc.date.issued2009
dc.identifier.isbn0957-4522
dc.identifier.urihttp://dais.sanu.ac.rs/123456789/3467
dc.description.abstractIntrinsic resistivity and carrier transport parameters of sintered nickel manganite samples (NTC thermistor grade) were determined using a Hall effect measurement system based on the van der Pauw method. Powder mixtures composed of MnO, NiO and with small amounts of CoO and Fe 2O 3 were free surface energy activated by milling in an ultra fast planetary mill for 5, 15, 30, 45 and 60 min. The powders were uniaxially pressed with 196 MPa into discs and sintered at 1200 °C for 60 min. Full characterization of nickel manganite samples was done using SEM, EDS and XRD analysis. The Hall effect was measured at different temperatures (room temperature, 50, 80, 100 and 120 °C) with an applied field of 0.37 T and also 0.57 T at room temperature. The activation energy E a (energy of conduction) and the coefficient of temperature sensitivity B 25/80, were calculated from measured resistivity values. The measured mobility, resistivity/conductivity, U-I plots, and Hall coefficients were mutually compared and correlated versus microstructure development and macroscopic parameters such as the powder activation time and ambient temperature. © Springer Science+Business Media, LLC 2008.
dc.publisherSpringer
dc.relationinfo:eu-repo/grantAgreement/MESTD/MPN2006-2010/142011/RS//
dc.rightsrestrictedAccess
dc.sourceJournal of Materials Science: Materials in Electronics
dc.subjectnickel manganite
dc.subjectHall effect
dc.subjectelectrical properties
dc.subjecttransport properties
dc.titleElectrical and transport properties of nickel manganite obtained by Hall effect measurements
dc.typearticleen
dc.rights.licenseARR
dcterms.abstractСтојановић, Г. М.; Луковић Голић, Данијела Т.; Aлексíћ, Обрад С.; Савић, Славица М.; Николић, Мариа Весна; Николић, Пантелија М.;
dc.citation.spage242
dc.citation.epage247
dc.citation.volume20
dc.citation.issue3
dc.identifier.doi10.1007/s10854-008-9710-5
dc.identifier.scopus2-s2.0-58649121067
dc.type.versionpublishedVersion
dc.identifier.fulltexthttp://dais.sanu.ac.rs/bitstream/handle/123456789/3467/Savic_Journal of Materials Science.Materials in Electronics_20_2009_242-247.pdf


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Приказ основних података о документу