A Detailed XRD and FTIR Analysis of Bi2O3 Doped ZnO-SnO2 Ceramics
Nikolić, Maria Vesna
Paraskevopoulos, Konstantinos M.
Blagojević, Vladimir D.
Nikolić, Pantelija M.
Ristić, Momčilo M.
Conference object (Published version)
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Poster presented at the 2nd International Congress on Ceramics, Verona, Italy, June 29 - July 4, 2008
ZnO-SnO2 ceramics were prepared with a traditional powder mixed oxide route by mixing starting powders of ZnO and SnO2 in the molar ratio 2:1 and adding small amounts (0.5; 1.0; and 1.5 molar%) of Bi 2O3. These mixtures were then mechanically activated for 10 minutes in a planetary ball mill, uniaxially pressed and sintered at 1300°C for 2h. The phase composition of the sintered samples was determined with X-ray Diffraction (XRD) analysis and a detailed Rietveld analysis was performed. Room temperature far infrared reflectivity diagrams were obtained using Bruker 113V FTIR spectrometer and fitted with several theoretical models in other to determine parameter values for some structural and optical properties of the obtained material.